Book Review : New Horizons in Testing: Latent Trait Test Theory and Computerized Adaptive Testing David J. Weiss (Ed.) New York: Academic Press,1983,345 pp.,$35.00
Available accessReview articleFirst published online September, 1984
Book Review : New Horizons in Testing: Latent Trait Test Theory and Computerized Adaptive Testing David J. Weiss (Ed.) New York: Academic Press,1983,345 pp.,$35.00