Photoluminescence piezospectroscopy (PLPS) has been used to determine residual stresses in sapphire, alumina in the yttria stablised zirconia (YSZ)/Al2O3 composite and alumina in thermal barrier coatings (TBCs). The TBC of YSZ containing 0·5 wt-% alumina has been produced using electron beam physical vapour deposition. The stress profile through the TBC thickness was measured using a depth sensing method. Reasonable residual stress profiles have been obtained using PLPS with the confocal system for all three material systems. Measurements of TBCs suggest that stress distribution in a TBC system is not uniform in general. However, uniform stress distribution has been found in some positions where damage in TBCs might occur.
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